High-throughput and full automatic DBC-module screening tester for high power IGBT

نویسندگان

  • Masanori Tsukuda
  • H. Tomonaga
  • S. Okoda
  • R. Noda
  • K. Tashiro
  • Ichiro Omura
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015